Friday, October 28, 2011

Workshop on Basic Principles of Scanning Electron Microscopy and its Applications in Material Sciences at NEHU, Shillong

SOPHISTICATED ANALYTICAL INSTRUMENT FACILITY
NORTH EASTERN HILL UNIVERSITY
Shillong-793 022




Workshop on Basic Principles of Scanning Electron Microscopy and its Applications in Material Sciences
(6th - 8 th March, 2012)


Sophisticated Analytical Instrument Facility (SAIF), North-Eastern Hill University,      Shillong – 793 022 will organize a "Workshop on Basic Principles of Scanning Electron Microscopy and its Applications in Material Sciences”, 6th – 8th March, 2012.

Applications are invited for admission to the Workshop from the persons who desire to use Electron Microscopy for their research work. The persons who have not attended any similar course in SAIF, NEHU or elsewhere and have basic knowledge and experience in Scanning Electron Microscopy will be given preference.   The application forwarded through proper channel of the Institution/Department should be sent to “The Head, SAIF, North-Eastern Hill University, Shillong – 793 022” latest by 13th February, 2012.

The selected applicants will have to pay for their boarding and lodging at NEHU Guest House as well as a Registration fee (Rs.1000/-for Research Scholars and Rs. 2000/- for Teachers/Scientists).

CONTACT PERSON:
Prof. B.B.P. Gupta
Head, SAIF, NEHU 

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